X-ray Wizards is capable of performing small angle x-ray scattering(SAXS) with both a line or point source. This enables high resolution scans for the determination of particle size distributions including particle shape analysis. The 2D patterns enable the measurement of particle size and orientation in a single image.

SAXS in combination with the measurement of crystallite size can be used to determine the thickness of an amorphous region about a crystal. For example, the thickness of an amorphous region around a metal catalyst or any crystalline based nanoparticles can be determined using WAXS and determining the average crystal size ( crystallite size determination) and subtracting that measurement from the average particle size determined from a SAXS.

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